Resume 5

OBJECTIVE:

Design/test engineer or researcher position in the area of analog, digital and mixed-signal VLSI design and test.

Sep. 1998 Present
Ph.D Student
School of Electrical Engineering and Computer Science
Ohio University, Dayton, OH, USA
GPA: 3.8/4.0
Dissertation: Analog and mixed-signal test and fault diagnosis
Expected Graduation Date: Spring or Summer 2002.

Sep.1993 Jul. 1996
M.S.
Weak Signal Detection Lab, Institute of Physics,
China Academy of Sciences,Beijing, P.R.China.
GPA: 85/100

Sep. 1989 Jul. 1993
B.E.
Department of Electrical Engineering & Automation,
Tianjin University, Tianjin, P.R.China.
GPA: 87/100

• Project: Analog and mixed-signal test and fault diagnosis
• Skills: Analog and mixed-signal test, Analog simulation, VHDL design, VLSI CMOSdesign and test.

• Project: Testing strategies for mixed-signal systems with embedded software
• Skills: Analog and mixed-signal test, analog simulation, data acquisition by GPIB and Labview.

• Responsible for designing and constructing the STS2106A MS/LS Digital IC Test System.
• Skills:
  • Board-level analog and mixed-signal design, layout, debug, test.
  • Digital design with EPLD devices, digital IC Test.
  • Digital ATE maintenance as application engineer.

• Project "The design and construction of part of ECS for low temperature scanning tunneling microscope", supported by China National Science Foundation.
• Skills: Low-noise analog design, layout and test, pre-amplifier design, feedback control design.

• Project: An algorithm for the computation of power analysis in power systems by Fortran77

1989 Tianjin University Distinguished New Student Award.
Tianjin University Outstanding Student Scholarships in 1990, 1991, 1992.
1996 Institute of Physics Outstanding Graduate Students Award Nominee.
2002 Ohio University Outstanding Graduate Student Award Nominee in process .

• 4+ year experiences in board-level digital, analog and mixed-signal design including 2-year industrial experience.
• 2 year industrial experiences in digital IC test;
• 2 year experiences in low-noise analog design and feedback control design.
• 4+ year experiences in schematics, synthesis, simulation, test, place & route, verification.
• 4 year experiences in analog and mixed-signal test and fault diagnosis;
• Excellent writing communication skills and team-work ability.

• Languages: C/C++, Fortran, Assembly Language, Basic, JAVA, Matlab, Labview, VHDL;
• Hardware Debug: Logic analyzer, Oscilloscope.
• Circuit Schematic Tools: OrCAD, Tango, Protel, CADSTAR;
• Analog Simulation Tools: Spice, Saber.
• VHDL design by Active-VHDL and implemented by XILINX FPGA.
• Digital design by ALTERA Max+Plus II and implemented by MAX7000 EPLD devices.
• VLSI transistor-level CMOS Design and Test by Mentor Graphics: Design Architect, QuickSim, ICStation, Lsim, AccuSim, AutoLogic, Leonardo, BISTA, ATPG, AutoLogic II, QuickFault, QuickGrade, QuickSim, QuickPath.

Brendan Harrison, Kang Qinghong, Carl Webster and Bryan Barrett, Nonrandom quantization errors in timebases, IEEE Transactions on Instrumentation and Measurement, vol. 50, pp. 888-892, 2001.

Kang Qinghong, Carl Webster, "A generalized fault diagnosis in dynamic analogue circuits," International Journal of Circuit Theory and Applications, vol.30, no.4, 2002.

Carl Webster, Kang Qinghong, Zhi-Hong Liu and Jerzy Rutkowski, Entropy-based optimum test points selection for analog fault dictionary techniques, submitted to IEEE Transactions on Instrumentation and Measurement.

Carl Webster and Kang Qinghong, Generalized decomposition method by multiple-measurement and multiple-frequency for analog fault diagnosis, submitted to IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications.

1. Brendan Harrison, Kang Qinghong, Carl Webster and Bryan Barrett, "A new method to compensate quantized time-base nonlinearity of sampling instruments," Workshop on Software Embedded Systems Testing, National Institute of Standards and Technology, Gaithersburg, MD, Nov. 1999.

2. Brendan Harrison, Kang Qinghong, Carl Webster and Bryan Barrett, Nonrandom quantization errors in timebases, Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference, vol. 1, pp. 235-240, Baltimore, MD, May 2000.

3. Carl Webster and Kang Qinghong, "A method for multiple fault diagnosis in analog circuits," Proceedings of the 33rd Southeastern Symposium on System Theory, pp. 65-68, Dayton, OH, Mar. 2001.

4. Carl Webster and Kang Qinghong, Multiple-fault diagnosis of analog circuits by locating ambiguity groups of test equation, Proceedings of the IEEE International Symposium of Circuits and Systems, vol. 5, pp. 199-202, Sydney, Australia, May 2001.

5. Carl Webster and Kang Qinghong, "A new approach to multiple fault diagnosis in linear analog circuits," Proceeding of the 7th IEEE International Mixed Signal Testing Workshop, Atlanta, GA, Jun. 2001.

6. Carl Webster and Kang Qinghong, Multiple fault diagnosis of analog circuits based on large change sensitivity analysis," the Proceedings of the 15th European Conference on Circuit Theory and Design, Espoo, Finland. Aug. 2001.

7. Carl Webster and Kang Qinghong, A decomposition method for analog fault location," accepted by the IEEE International Symposium of Circuits and Systems, Scottsdale, Arizona, USA, May 2002.

8. Carl Webster and Kang Qinghong, Locating stuck faults in analog circuits," accepted by the IEEE International Symposium of Circuits and Systems, Scottsdale, Arizona, USA, May 2002.